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automatic scan mode

См. также в других словарях:

  • Scan chain — Scan chains are a technique used in Design For Test. The objective is to make testing easier by providing a simple way to set and observe every flip flop in an IC. A special signal called scan enable is added to a design. When this signal is… …   Wikipedia

  • Automatic number plate recognition — The system must be able to deal with different styles of license plates …   Wikipedia

  • Boundary Scan — und Grenzpfadabtastung sind synonyme Begriffe für ein standardisiertes Verfahren zum Testen digitaler und analoger Bausteine in der Elektronik. Heutzutage ist es üblich, die Verschaltung von Platinen mehr auf zusätzliche innere… …   Deutsch Wikipedia

  • M16 rifle — Rifle, 5.56 mm, M16 From top to bottom: M16A1, M16A2, M4A1, M16A4 Type Assault rifle Place  …   Wikipedia

  • Conical scanning — is a system used in early radar units to improve their accuracy, as well as making it easier to steer the antenna properly to point at a target. Conical scanning is similar in concept to the earlier lobe switching concept used on some of the… …   Wikipedia

  • Minolta Dimage 7, 7i, 7hi — Minolta DiMage 7i The Minolta DiMage 7, 7i, 7Hi series is a pro sumer line of digital electronic viewfinder cameras from Minolta. These are also known as bridge digital cameras. They are capable of capturing images in the 5 megapixel range. The… …   Wikipedia

  • CAC/PAC JF-17 Thunder — JF 17 Thunder FC 1 Xiaolong …   Wikipedia

  • Intel GMA — GMA X3000 on Intel DG965WHMKR motherboard (only heat sink visible) The Intel Graphics Media Accelerator, or GMA, is a series of Intel integrated graphics processors built into various motherboard chipsets. These integrated graphics products allow …   Wikipedia

  • SCR-584 radar — The SCR 584 (short for Signal Corps Radio # 584 ) was a microwave radar developed by the MIT Radiation Laboratory during World War II. It replaced the earlier and much more complex SCR 268 as the US Army s primary anti aircraft gun laying system… …   Wikipedia

  • Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… …   Wikipedia

  • Computed tomography — tomos (slice) and graphein (to write).Computed tomography was originally known as the EMI scan as it was developed at a research branch of EMI, a company best known today for its music and recording business. It was later known as computed axial… …   Wikipedia

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